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Title: Pinch Test
Url: https://www.nnin.org/education-training/k-12-teachers/nanotechnology-c...
Publisher: National Nanotechnology Infrastructure Network
Description:

This lesson, presented by the National Nanotechnology Infrastructure Network, covers the general concepts of size or SI prefixes. Students will study what equipment or tools a person would need to view objects of particular sizes. The less can be used in multiple ways including "to see how much students know before teaching; to introduce them to the topic; or to assess what they have learned after teaching about size and SI prefixes." A Teacher Preparation Guide and PowerPoint images are included.

LC Classification: Science -- Physics -- Weights and measures -- Special systems -- Metric system. International system (SI) -- Study and teaching. Research
Science -- Physics -- Weights and measures -- Study and teaching. Research
Technology -- Technology (General) -- Nanotechnology
GEM Subject: Science -- Engineering
Science -- Technology
Science -- Instructional issues
Key Concept: Mathematics -- Measurement
Resource Type: Instructional Material
Instructional Material -- Lesson/Lesson Plan
Instructional Material -- Interactive Simulation
Format: Document -- PDF
Document -- PPT
Document -- HTML
Audience: Educator
Education Level: High School
Language: English
Rights: National Nanotechnology Infrastructure Network, (NNIN)
Access Rights: Free access
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Source Type: ATE Project
Source: ATE Projects
Full Record Views: 2
Resource URL Clicks: 5
Cumulative Rating: NOT YET RATED
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